In the present study, Graphene oxide (GO) was deposited using inexpensive and environmentally-compatible methods on the nickel oxide foam. Then, GO thin films have been reduced by Cyclic Voltammetry (CV), Chronoamperometry and Chronopotentiometry modes of electrodeposition. The effects of different modes on structural, surface morphological and supercapacitive properties of ERGO thin films have been investigated by X-ray diffraction (XRD), Scanning electron microscope (SEM), Raman spectroscopy, Cyclic Voltammetry, and Galvanostatic charge and discharge (GCD). Formation of ERGO by all three modes is confirmed by X-ray diffraction (XRD) patterns. A Significant change in the surface morphologies of the ERGO thin film due to different modes has been observed. The supercapacitive properties of ERGO thin films have been studied in 1 M KOH electrolyte. The maximum supercapacitance obtained for potentiodynamic, potentiostatic, and galvanostatic modes is 1380, 1259, and 1995 F/g, respectively which is completely in agreement with the special level and impedance results. The results showed that the constant current method is the best way for the electrochemical reducing of graphene oxide. In this way, most functional groups have been reduced. In addition, a high density of the defects and wrinkling of the sheets is observed. Consequently, the method can replace chemical methods for the reducing of graphene oxide and eliminate the major weakness of chemical methods that use toxic substances.