عنوان مقاله [English]
Abstract In this research, PbTiO3 (PTO) thin films with 150 nm thickness were grown on (001) Nb-doped SrTiO3 substrates. High resolution X-ray diffraction (HR-XRD) studies showed that films are epitaxial with (001) orientation. The XRD data indicated that the PTO film was grown in  direction. The ф-scan of the film and substrate around (102) revealed a fourfold symmetry for both demonstrating  perfect orientation of the films. XRD reciprocal space map (RSM) around (103) of the film and substrate revealed that films are fully strained with a compressive strain. The lattice constants calculated from the horizontal and vertical peak positions are; a = 0.403 nm and c = 0.407 nm. This compressive strain was developed due to the lattice parameter mismatch of the film with respect to the substrate. The topography of the films was studied by an atomic force microscope (AFM). Topography studies showed that films are highly uniform with densely packed elongated grains developed along the  and  orientations. Ferroelectric domain configuration was investigated by a piezoelectric force microscope (PFM). Two types of 180 and 90 degrees ferroelectric domains were observed. The epitaxial compressive strain is responsible for the formation of 90 degree domains. The developed strain via the lattice mist-match between the PTO layer and the substrate enforces electrical dipoles to rotate away from the normal direction to compensate the elastic energy of the film.